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Stock image semiconductor silicon wafer undergoing probe testing
Published:
Dec.05, 2017 11:50:28
Author:
genkur
Views:
181
Downloads:
17
File type:
image
/
jpg
File size:
4.39 MB
Orginal size:
4320
x
2880
px
Available sizes:
S
(500 x 333)
M
(1000 x 667)
L
(2000 x 1333)
XL
(4320 x 2880)
EL0
(4320 x 2880)
Level:
bronze
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Image topics:
Computer
Circle
Crystal
Equipment
Board
Electrical
Technology
Voltage
Machine
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Electronic
Digital
Electronics
Measurement
Test
Pad
Lab
Laboratory
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System
Quality
Station
Needle
Disk
Die
Processor
Process
Sensor
Chip
Circuit
Silicon
Semiconductor
Cpu
Probe
Microscope
Transistor
Microcontroller
Wafer
Cmos
Tips
Ic
Prober
Asic
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